Solid flexRIXS: A RIXS endstation for solid systems at BESSY II
DOI:
https://doi.org/10.17815/jlsrf-3-91Abstract
The solid flexRIXS endstation combines an X-ray emission spectrometer with resolving powers above 1000 with a diffractometer setup for solid sample systems. It is flexible in its use at different beam lines and facilities.References
Beye, M., Hennies, F., Deppe, M., Suljoti, E., Nagasono, M., Wurth, W., & Föhlisch, A. (2009). Dynamics of Electron-Phonon Scattering: Crystal- and Angular-Momentum Transfer Probed by Resonant Inelastic X-Ray Scattering. Physical Review Letters, 103, 237401. http://dx.doi.org/10.1103/PhysRevLett.103.237401
Beye, M., Hennies, F., Deppe, M., Suljoti, E., Nagasono, M., Wurth, W., & Föhlisch, A. (2010). Measurement of the predicted asymmetric closing behaviour of the band gap of silicon using x-ray absorption and emission spectroscopy. New Journal of Physics, 12(4), 043011. http://dx.doi.org/10.1088/1367-2630/12/4/043011
Beye, M., Schreck, S., Sorgenfrei, F., Trabant, C., Pontius, N., Schuszler-Langeheine, C., . . . Föhlisch, A. (2013). Stimulated X-ray emission for materials science. Nature, 501(7466), 191-194. http://dx.doi.org/10.1038/nature12449
Beye, M., Sorgenfrei, F., Schlotter, W. F., Wurth, W., & Föhlisch, A. (2010). The liquid-liquid phase transition in silicon revealed by snapshots of valence electrons. Proceedings of the National Academy of Sciences, 107, 16772-16776. http://dx.doi.org/10.1073/pnas.1006499107
Cite article as: Helmholtz-Zentrum Berlin für Materialien und Energie. (2017). Solid flexRIXS: A RIXS endstation for solid systems at BESSY II. Journal of large-scale research facilities, 3, A124. http://dx.doi.org/10.17815/jlsrf-3-91
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