Solid flexRIXS: A RIXS endstation for solid systems at BESSY II

Authors

  • Martin Beye Helmholtz-Zentrum Berlin für Materialien und Energie
  • Pieter Sybren Miedema Helmholtz-Zentrum Berlin für Materialien und Energie

DOI:

https://doi.org/10.17815/jlsrf-3-91

Abstract

The solid flexRIXS endstation combines an X-ray emission spectrometer with resolving powers above 1000 with a diffractometer setup for solid sample systems. It is flexible in its use at different beam lines and facilities.

References

Beye, M., Hennies, F., Deppe, M., Suljoti, E., Nagasono, M., Wurth, W., & Föhlisch, A. (2009). Dynamics of Electron-Phonon Scattering: Crystal- and Angular-Momentum Transfer Probed by Resonant Inelastic X-Ray Scattering. Physical Review Letters, 103, 237401. http://dx.doi.org/10.1103/PhysRevLett.103.237401

Beye, M., Hennies, F., Deppe, M., Suljoti, E., Nagasono, M., Wurth, W., & Föhlisch, A. (2010). Measurement of the predicted asymmetric closing behaviour of the band gap of silicon using x-ray absorption and emission spectroscopy. New Journal of Physics, 12(4), 043011. http://dx.doi.org/10.1088/1367-2630/12/4/043011

Beye, M., Schreck, S., Sorgenfrei, F., Trabant, C., Pontius, N., Schuszler-Langeheine, C., . . . Föhlisch, A. (2013). Stimulated X-ray emission for materials science. Nature, 501(7466), 191-194. http://dx.doi.org/10.1038/nature12449

Beye, M., Sorgenfrei, F., Schlotter, W. F., Wurth, W., & Föhlisch, A. (2010). The liquid-liquid phase transition in silicon revealed by snapshots of valence electrons. Proceedings of the National Academy of Sciences, 107, 16772-16776. http://dx.doi.org/10.1073/pnas.1006499107


Cite article as: Helmholtz-Zentrum Berlin für Materialien und Energie. (2017). Solid flexRIXS: A RIXS endstation for solid systems at BESSY II. Journal of large-scale research facilities, 3, A124. http://dx.doi.org/10.17815/jlsrf-3-91

Published

2017-11-30

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