V6: The Reflectometer at BER II

Authors

  • Marcus Trapp Helmholtz-Zentrum Berlin für Materialien und Energie

DOI:

https://doi.org/10.17815/jlsrf-3-154

Abstract

V6 is a fixed wavelength reflectometer dedicated to the investigation of thin films and surface structures at solid-air, solid-liquid and free liquid surfaces. The instrument is equipped with polarization analysis for studies of magnetic thin films, also in external magnetic fields and at low temperature.

References

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Jerliu, B., Dörrer, L., Huger, E., Borchardt, G., Steitz, R., Geckle, U., . . . Schmidt, H. (2013). Neutron reflectometry studies on the lithiation of amorphous silicon electrodes in lithium-ion batteries. Phys. Chem. Chem. Phys., 15, 7777-7784. http://dx.doi.org/10.1039/C3CP44438D

Jerliu, B., Hüger, E., Dörrer, L., Seidlhofer, B.-K., Steitz, R., Oberst, V., . . . Schmidt, H. (2014). Volume Expansion during Lithiation of Amorphous Silicon Thin Film Electrodes Studied by In-Operando Neutron Reflectometry. The Journal of Physical Chemistry C, 118(18), 9395-9399. http://dx.doi.org/10.1021/jp502261t

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Cite article as: Helmholtz-Zentrum Berlin für Materialien und Energie. (2017). V6: The Reflectometer at BER II. Journal of large-scale research facilities, 3, A114. http://dx.doi.org/jlsrf-3-154

Published

2017-05-24

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