The μmRIXS spectrometer at BESSY II

Annette Pietzsch


The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.


Könnecke, R., Follath, R., Pontius, N., Schlappa, J., Eggenstein, F., Zeschke, T., . . . Föhlisch, A. (2013). The confocal plane grating spectrometer at BESSY II. Journal of Electron Spectroscopy and Related Phenomena, 188, 133 - 139.

Cite article as: Helmholtz-Zentrum Berlin für Materialien und Energie. (2016). The mmRIXS spectrometer at BESSY II. Journal of large-scale research facilities, 2, A55.




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