FEI Titan 80-300 STEM

Authors

DOI:

https://doi.org/10.17815/jlsrf-2-67

Abstract

The FEI Titan 80-300 STEM is a scanning transmission electron microscope equipped with a field emission electron gun, a three-condenser lens system, a monochromator unit, and a Cs probe corrector (CEOS), a post-column energy filter system (Gatan Tridiem 865 ER) as well as a Gatan 2k slow scan CCD system. Characterised by a STEM resolution of 80 pm at 300 kV, the instrument was one of the first of a small number of sub-ångström resolution scanning transmission electron microscopes in the world when commissioned in 2006.

References

Cui, C., Gan, L., Heggen, M., Rudi, S., & Strasser, P. (2013). Compositional segregation in shaped Pt alloy nanoparticles and their structural behaviour during electrocatalysis. Nature Materials, 12(8), 765-771. http://dx.doi.org/10.1038/nmat3668

Heggen, M., Houben, L., & Feuerbacher, M. (2010). Plastic-deformation mechanism in complex solids. Nature Materials, 9(4), 332-336. http://dx.doi.org/10.1038/nmat2713

Heidelmann, M., Barthel, J., & Houben, L. (2009). StripeSTEM, a technique for the isochronous acqui-sition of high angle annular dark-field images and monolayer resolved electron energy loss spectra. Ultramicroscopy, 109(12), 1447-1452. http://dx.doi.org/10.1016/j.ultramic.2009.07.007

Luysberg, M., Heidelmann, M., Houben, L., Boese, M., Heeg, T., Schubert, J., & Roeckerath, M. (2009). Intermixing and charge neutrality at DyScO3/SrTiO3 interfaces. Acta Materialia, 57(11), 3192-3198. http://dx.doi.org/10.1016/j.actamat.2009.03.031.


Cite article as: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) et al. (2016). FEI Titan 80-300 STEM. Journal of large-scale research facilities, 2, A42. http://dx.doi.org/10.17815/jlsrf-2-67

Published

2016-02-01

Issue

Section

Articles

URN